A Scanning Electron Microscope (SEM), is a kind of electron microscope that uses beams of electrons – instead of beams of light – to create an image of a sample in a raster scan pattern by capturing information about the structure’s surface topography and the composition of the sample and its properties.
Using a Scanning Electron Microscope (SEM) specimens can be documented at high magnification and sharp focus, resulting in detailed magnified images of samples.
The SEM allows for prototyping and proof of concept testing, which reduces time to market by obtaining insights regarding the specific nature of the specimen.
The JEOL NeoScope SEM offers amazing surface magnifications by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM.
This SEM is a touch panel controlled, desktop scanning microscope.The JCM-6000Plus has high-sensitivity semiconductor detectors making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The SEM makes it possible to clearly observe fine structures on the specimen surface at high magnification.