Description

JEOL JCM-6000 Neoscope Scanning Electron Microscope (SEM)

A Scanning Electron Microscope (SEM) uses a beam of electrons instead of light to create images of a sample’s surface or sub-surface composition. Using an SEM, specimens can be imaged at high magnification and with sharp focus, resulting in detailed magnified images of conductive samples. The SEM allows for the inspection of very small objects or features, which reduces time to market by obtaining insights regarding the specific nature of the specimen.

The JEOL NeoScope SEM offers amazing surface magnifications by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM.

This SEM is a computer-controlled, desktop scanning electron microscope. The JCM-6000Plus has high-sensitivity semiconductor detectors making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The SEM makes it possible to clearly observe fine structures on the specimen surface at high magnification.

FEATURES

• Automatic image formation after sample introduction within 3 minutes
• High resolution (60,000X) and large depth of field
• Multi-touch screen interface for intuitive operation
• Advance automatic functions (focus, stigmation, brightness/contrast)
• High and low vacuum modes
• Three selectable accelerating voltages
• Secondary electron and solid-state backscattered electron detector
• Large sample coverage (up to 70 mm diameter)
• Options include: motor drive stage and EDS