A Scanning Electron Microscope (SEM), is a kind of microscope that uses beams of electrons – instead of beams of light – to create an image of a sample. The capture is a raster scan pattern which offers information about the structure’s surface topography, its composition, and its properties.
The JCM-6000 Plus has high-sensitivity semiconductor detectors making it easy to acquire composition contrast information about the specimen, thus enabling efficient analysis.
The SEM makes it possible to clearly observe fine structures on a specimen surface at high magnification.