Scanning Electron Microscope

A Scanning Electron Microscope (SEM), is a kind of electron microscope that uses beams of electrons – instead of beams of light – to create an image of a sample in a raster scan pattern by capturing information about the structure’s surface topography and the composition of the sample and its properties.

Using a Scanning Electron Microscope (SEM) specimens can be documented at high magnification and sharp focus, resulting in detailed magnified images of samples.

The SEM allows for prototyping and proof of concept testing, which reduces time to market by obtaining insights regarding the specific nature of the specimen.

Description

Description

JEOL JCM-6000 Neoscope Scanning Electron Microscope (SEM)

The JEOL NeoScope SEM offers amazing surface magnifications by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM.

This SEM is a touch panel controlled, desktop scanning microscope.The JCM-6000Plus has high-sensitivity semiconductor detectors making it easy to acquire composition contrast information about the specimen, and enabling efficient analysis. The SEM makes it possible to clearly observe fine structures on the specimen surface at high magnification.

 

FEATURES

  • Automatic image formation after sample introduction within 3 minutes
  • High resolution (60,000X) and large depth of field
  • Multi-touch screen interface for intuitive operation
  • Advance automatic functions (focus, stigmation, brightness/contrast)
  • High and low vacuum modes
  • Three selectable accelerating voltages
  • Secondary electron and solid state backscattered electron detector
  • Large sample coverage (up to 70 mm diameter)
  • Options include: motor drive stage and EDS