Scanning Electron Microscope
A Scanning Electron Microscope (SEM), is a kind of microscope that uses beams of electrons – instead of beams of light – to create an image of a sample. The capture is a raster scan pattern which offers information about the structure’s surface topography, its composition, and its properties.
Description
Description
JEOL JCM-6000 Neoscope Scanning Electron Microscope (SEM)
The JCM-6000 Plus has high-sensitivity semiconductor detectors making it easy to acquire composition contrast information about the specimen, thus enabling efficient analysis.
The SEM makes it possible to clearly observe fine structures on a specimen surface at high magnification.
FEATURES
- Automatic image formation after sample introduction within 3 minutes
- High resolution (60,000X) and large depth of field
- Multi-touch screen interface for intuitive operation
- Advance automatic functions (focus, stigmation, brightness/contrast)
- High and low vacuum modes
- Three selectable accelerating voltages
- Secondary electron and solid-state backscattered electron detector
- Large sample coverage (up to 70 mm diameter)
- Options include: motor drive stage and EDS
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