My business is in New York state
    I want to reserve:

    Scanning Electron Microscope

    A Scanning Electron Microscope (SEM), is a kind of microscope that uses beams of electrons – instead of beams of light – to create an image of a sample. The capture is a raster scan pattern which offers information about the structure’s surface topography, its composition, and its properties.



    JEOL JCM-6000 Neoscope Scanning Electron Microscope (SEM)

    The JCM-6000 Plus has high-sensitivity semiconductor detectors making it easy to acquire composition contrast information about the specimen, thus enabling efficient analysis.

    The SEM makes it possible to clearly observe fine structures on a specimen surface at high magnification.



    • Automatic image formation after sample introduction within 3 minutes
    • High resolution (60,000X) and large depth of field
    • Multi-touch screen interface for intuitive operation
    • Advance automatic functions (focus, stigmation, brightness/contrast)
    • High and low vacuum modes
    • Three selectable accelerating voltages
    • Secondary electron and solid-state backscattered electron detector
    • Large sample coverage (up to 70 mm diameter)
    • Options include: motor drive stage and EDS