A Scanning Electron Microscope (SEM) uses a beam of electrons instead of light to create images of a sample’s surface or sub-surface composition, and now Hudson Valley Businesses have access to the JEOL SEM. By using an SEM, specimens can be imaged at high magnification and with sharp focus, resulting in detailed magnified images of conductive samples. [caption id="attachment_6075" align="aligncenter" width="300"] JEOL JCM 6000 Neoscope Scanning Electron...

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